WHAT: Will exhibit at the 52nd Design Automation Conference (DAC) in Booth #3126, showcasing its new OneSpin 360 LaunchPad™, an adaptive formal technology platform, and OneSpin 360 Qualify™, formal fault qualification analysis for safety critical systems. Demonstrations of its entire formal verification product portfolio will be available publicly and in OneSpin’s suites by appointment.
WHEN: Monday, June 8, and Tuesday, June 9, from 10 a.m. until 7 p.m. and Wednesday, June 10, from 10 a.m. until 6 p.m.
WHERE: Moscone Center, San Francisco
Dr. Brinkmann will participate in a panel discussion titled, “Key Challenges of Verification and Validation of Modern Semiconductor IP,” Tuesday, June 9, from 11:30 a.m. until noon in Room 101. Moderated by Brian Bailey of Semiconductor Engineering, panelists will discuss key challenges to verify and validate semiconductor devices.
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